MSU Test Rack
                            =============

                                            Friday, September 12, 1997

Goals, Usage of a Test Rack at MSU:
-----------------------------------

 a) Develop, test, exercise the control and monitoring software
 b) Commission, debug, repair the cards, paddle boards, cables
 c) Emergency spares: cards, crates, adaptors, TCC, Power Supplies
 d) Covers L1FW, per bunch scalers, L2FW
 e) Provide service for 1-2 L2 alpha test crate, and maybe give them a home
 f) Test or include home for optional High Speed Readout?
 g) Test or include home for optional SLIM?

Number of Crates, Racks in the test setup:
------------------------------------------

No matter how hard we try, we could never make everything (L1FW+L2FW+scalers)
fit in just 1 Test Trigger crate.

We could define an appropriate subset of the full system that is compact enough
to fit somewhat comfortably in 2 Trigger Crates.  There might even be enough
room left so that most of the test system had a chance to fit in just one rack.

The Run I Test Rack was made of an odd collection of bits and pieces, but this
time we CAN and SHOULD use only standard trigger backplanes, crates, cards,
paddle boards, power supplies.  We can push this one step furhter and actually
use a rack that is 100% identical to the production system (meaning 3 Trigger
crates+PS), and can thus serve as an emergency spare rack.

This makes a very comfortable test setup with one 100% standard rack for the
trigger per se, and another rack for the rest (TCC communication VME crate, VBD
crate, L2 Alpha crate(s), SLIM crate...).

Test Rack Life Phases:
---------------------

Experience from Run I sugests that there are two main phases in the life of the
test racks.  During the "commissioning phase", all new cards are successively
tested, and exercized.  During this commissioning phase, the card count in the
testrack will be at its highest so as to include the maximum number of
different features and the maximum multiplicity of each feature.  During the
"support phase" we maintain a minimal system configuration to test new pieces
of software or hardware, and allow debugging of problems observed on the online
system.  During this support phase, the card count is kept as low as possible,
to limit the number of cards exposed to dust, corrosion, fingers...

Since we decided that the "TestRack" is a standard production rack, we can thus
start building it as an exact copy of the production L1 FW rack, and the first
test rack might then (or will probably) become the L1FW rack actually delivered
at DZero. (not unlike Run I)

While we commission or test Per Bunch scaling, we can probably fit all 16 cards
of the "SM for Exposure Group #0:7" into the upper slots of the "TDM Crate"
alongside a minimum number (1-2) of TDM cards, or migrate these few TDM cards
to the "FOM rack".  Later, during the support phase, one set of 2 cards (i.e.
the two SM for Exposure Group #0) can find a home in the "FOM Crate".

We will later need to build/add the L2FW (about 10-12 cards). The Test version
of the L2 FW can probably fit in the "TDM crate" alongside the minimum number
(1-2) of TDM cards, or migrate the few TDM cards to the "FOM Crate".

Setup:
------

 I) TCC + Bit3 PCI-VME Adaptor + 25 foot copper cable

 II) Rack #1 = Standard Trigger Rack

    a) Crate #1 = 9U Trigger Crate = "FOM Crate"

     1)  TOM with Vertical Interconnect Slave
     2)  TRM for individual Disables for Sp Trg 0:31
     3)    [open] TRM for individual Disables for Sp Trg 32:63
     4)    [open] TRM for individual Disables for Sp Trg 64:95
     5)    [open] TRM for individual Disables for Sp Trg 96:127
     6)  Pass-Through Card: Individual Disables->TDM
     7)  TRM for Global Disables
     8)    [open] Pass-Through Card: Global Disables->TDM
     9)  SM Items 0:95 [Geo Sect BX Num, Tick Turn]
     10) SM Items 96:191 [Geo L1 Trig Num, Tick Turn]
     11) SM Items 192:287 [Geo Sect L3 Trans Num, Seq L1 Trig Num]
     12)   [open] SM Items 288:383
     13)   [open] Open Slot                    (SM Expos Group #0 Ticks 1:80)
     14)   [open] Open Slot                    (SM Expos Group #0 Ticks 81:160)
     15)   [open] Pass-Through Card: L1 Accept->SLIM
     16) FOM L1 Accept for Geo Sect 0:63
     17)   [open] FOM L1 Accept for Geo Sect 64:127
     18) FOM Diagnostic Map
     19) FOM L1 Accept Qualifiers, Skip Next BX
     20)   [open] FOM ???
     21)   [open] Pass-Through Card: Qualifiers->SLIM

    b) Crate #2 = 9U Trigger Crate = "TDM Crate"

     1)  TOM with Vertical Interconnect Slave
     2)    [open] Pass-Through Card: Misc -> TDM
     3)  TDM Spec Trig 0:7
     4)  TDM Spec Trig 8:15
     5)    [open] TDM Spec Trig 16:23
     6)    [open] TDM Spec Trig 24:31          (SM Expos Group #0 Ticks 1:80)
     7)    [open] TDM Spec Trig 32:39          (SM Expos Group #0 Ticks 81:160)
     8)    [open] TDM Spec Trig 40:47          (SM Expos Group #1 Ticks 1:80)
     9)    [open] TDM Spec Trig 48:55          (SM Expos Group #1 Ticks 81:160)
     10)   [open] TDM Spec Trig 56:63          (SM Expos Group #2 Ticks 1:80)
     11)   [open] TDM Spec Trig 64:71          (SM Expos Group #2 Ticks 81:160)
     12)   [open] TDM Spec Trig 72:79          (SM Expos Group #3 Ticks 1:80)
     13)   [open] TDM Spec Trig 80:87          (SM Expos Group #3 Ticks 81:160)
     14)   [open] TDM Spec Trig 88:95          (SM Expos Group #4 Ticks 1:80)
     15)   [open] TDM Spec Trig 96:103         (SM Expos Group #4 Ticks 81:160)
     16)   [open] TDM Spec Trig 104:111        (SM Expos Group #5 Ticks 1:80)
     17)   [open] TDM Spec Trig 112:119        (SM Expos Group #5 Ticks 81:160)
     18)   [open] TDM Spec Trig 120:127        (SM Expos Group #6 Ticks 1:80)
     19) Pass-Through Card: SpTrg Fired->FOM   (SM Expos Group #6 Ticks 81:160)
     20)   [open] Open Slot                    (SM Expos Group #7 Ticks 1:80)
     21)   [open] Open Slot                    (SM Expos Group #7 Ticks 81:160)

    c) Crate #3 = 9U Trigger Crate = "And-Or Crate"

     1)  TOM with Vertical Interconnect Slave
     2)  TRM for And-Or Terms 0:63
     3)  TRM for And-Or Terms 64:127
     4)  Pass-Through Card: TRM->And-Or
     5)  And-Or Terms 0:127 Physics SpTrg 0:63
     6)    [open] And-Or Terms 0:127 Physics SpTrg 64:127
     7)  And-Or Terms 0:127 Exposure Group 0:7
     8)  Pass-Through Card: And-Or Fired->TDM
     9)    [open] TRM for And-Or Terms 0:63
     10)   [open] TRM for And-Or Terms 64:127
     11)   [open] Pass-Through Card: TRM->And-Or
     12)   [open] And-Or Terms 0:127 Physics SpTrg 0:63
     13)   [open] And-Or Terms 0:127 Physics SpTrg 64:127
     14)   [open] And-Or Terms 0:127 Exposure Group 0:7
     15)   [open] Pass-Through Card: And-Or Fired->TDM)
     16) TRM for Front-End Busy Geo Sect 0:63
     17)   [open] TRM for Front-End Busy Geo Sect 64:127
     18) Pass-Through Card: FE-Busy->FOM
     19) FOM L1 FE Busy -> Exposure Groups Disable
     20) Pass-Through Card: Exposure->TDM,scaler
     21)   [open] Open Slot


 III) Rack #2 = special rack.

    a) Crate #1 = (small) 6U VME Backplane as communication hub
       (or could be close to TCC, as in production setup)

     1) Bit3 TCC-VME Adaptor
     2) Vertical Interconnect Master
     3)     (Spare) Vertical Interconnect Master
     4) Bit3 VME-VME Adaptor for L2Glb
     5) Bit3 optical link module
     6)     (Spare) Bit3 VME-VME Adaptor for L2CTPP
     7)     (Spare) Bit3 optical link module

    b) Crate #2 = VME-for-Physics 9U crate
       High Speed Readout crate
         VRB Controller
         VRB(s)
         VBD

    c) Crate #3 = VME-for-Physics 9U
     L2 Global Test Crate


    d) Crate #4 = VME-for-Physics 9U
     L2 Cal Trig PreProcessor Test Crate


    e) SLIM Crate?